OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
A Timestep-Adaptive-Diffusion-Model-Oriented Unsupervised Detection Method for Fabric Surface Defects
Tang Shancheng, Zicheng Jin, Ying Zhang, et al.
Processes (2023) Vol. 11, Iss. 9, pp. 2615-2615
Open Access | Times Cited: 6
Tang Shancheng, Zicheng Jin, Ying Zhang, et al.
Processes (2023) Vol. 11, Iss. 9, pp. 2615-2615
Open Access | Times Cited: 6
Showing 6 citing articles:
YOLOSeg with applications to wafer die particle defect segmentation
Y.-H. Audrey Li, Yu-Cheng Chan, Chao Huang, et al.
Scientific Reports (2025) Vol. 15, Iss. 1
Open Access
Y.-H. Audrey Li, Yu-Cheng Chan, Chao Huang, et al.
Scientific Reports (2025) Vol. 15, Iss. 1
Open Access
Unsupervised fabric defect detection based on multiscale image reconstruction and structural similarity assessment
Zhiqi Yu, Yang Xu, Yuanfei Wang, et al.
Coloration Technology (2023) Vol. 140, Iss. 6, pp. 827-842
Closed Access | Times Cited: 4
Zhiqi Yu, Yang Xu, Yuanfei Wang, et al.
Coloration Technology (2023) Vol. 140, Iss. 6, pp. 827-842
Closed Access | Times Cited: 4
An industrial product surface anomaly detection method based on masked image modeling
Tang Shancheng, Heng Li, Fenghua Dai, et al.
Nondestructive Testing And Evaluation (2024), pp. 1-21
Closed Access | Times Cited: 1
Tang Shancheng, Heng Li, Fenghua Dai, et al.
Nondestructive Testing And Evaluation (2024), pp. 1-21
Closed Access | Times Cited: 1
A Survey on Surface Defect Inspection Based on Generative Models in Manufacturing
Yu He, Shuai Li, Xin Wen, et al.
Applied Sciences (2024) Vol. 14, Iss. 15, pp. 6774-6774
Open Access
Yu He, Shuai Li, Xin Wen, et al.
Applied Sciences (2024) Vol. 14, Iss. 15, pp. 6774-6774
Open Access
Semi-supervised Lightweight Fabric Defect Detection
Xiaoliang Dong, Hao Liu, Yaguang Luo, et al.
Lecture notes in computer science (2024), pp. 106-120
Closed Access
Xiaoliang Dong, Hao Liu, Yaguang Luo, et al.
Lecture notes in computer science (2024), pp. 106-120
Closed Access
Elevating Wafer Defect Inspection with Denoising Diffusion Probabilistic Model
Ping-Hung Wu, Thi Phuong Hoang, Yen-Ting Chou, et al.
Mathematics (2024) Vol. 12, Iss. 20, pp. 3164-3164
Open Access
Ping-Hung Wu, Thi Phuong Hoang, Yen-Ting Chou, et al.
Mathematics (2024) Vol. 12, Iss. 20, pp. 3164-3164
Open Access
