
OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
A Feature-Oriented Reconstruction Method for Surface-Defect Detection on Aluminum Profiles
Tang Shancheng, Ying Zhang, Zicheng Jin, et al.
Applied Sciences (2023) Vol. 14, Iss. 1, pp. 386-386
Open Access | Times Cited: 4
Tang Shancheng, Ying Zhang, Zicheng Jin, et al.
Applied Sciences (2023) Vol. 14, Iss. 1, pp. 386-386
Open Access | Times Cited: 4
Showing 4 citing articles:
Steel Surface Defect Detection Algorithm Based on Improved YOLOv8n
Tian Zhang, Pengfei Pan, Jie Zhang, et al.
Applied Sciences (2024) Vol. 14, Iss. 12, pp. 5325-5325
Open Access | Times Cited: 5
Tian Zhang, Pengfei Pan, Jie Zhang, et al.
Applied Sciences (2024) Vol. 14, Iss. 12, pp. 5325-5325
Open Access | Times Cited: 5
DMPDD-Net: An Effective Defect Detection Method for Aluminum Profiles Surface Defect
Tingting Sui, Junwen Wang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 74, pp. 1-13
Closed Access | Times Cited: 1
Tingting Sui, Junwen Wang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 74, pp. 1-13
Closed Access | Times Cited: 1
Development of a System for the Active Orientation of Small Screws
Penko Mitev
(2024), pp. 55-55
Open Access
Penko Mitev
(2024), pp. 55-55
Open Access
Aluminum Product Surface Defect Detection Method Based on Improved CenterNet
Zhihong Chen, Xuhong Huang, Ronghao Kang, et al.
IEEJ Transactions on Electrical and Electronic Engineering (2024)
Closed Access
Zhihong Chen, Xuhong Huang, Ronghao Kang, et al.
IEEJ Transactions on Electrical and Electronic Engineering (2024)
Closed Access