
OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
A Semi-Parallel Active Learning Method Based on Kriging for Structural Reliability Analysis
Zhian Li, Xiao Li, Chen Li, et al.
Applied Sciences (2023) Vol. 13, Iss. 2, pp. 1036-1036
Open Access | Times Cited: 3
Zhian Li, Xiao Li, Chen Li, et al.
Applied Sciences (2023) Vol. 13, Iss. 2, pp. 1036-1036
Open Access | Times Cited: 3
Showing 3 citing articles:
Dynamic reliability calculation of random structures by conditional probability method
Jan Kubica, Bilal Ahmed, Akbar Muhammad, et al.
Eksploatacja i Niezawodnosc - Maintenance and Reliability (2024) Vol. 26, Iss. 2
Open Access | Times Cited: 2
Jan Kubica, Bilal Ahmed, Akbar Muhammad, et al.
Eksploatacja i Niezawodnosc - Maintenance and Reliability (2024) Vol. 26, Iss. 2
Open Access | Times Cited: 2
Efficient computing technique for reliability analysis of high-dimensional and low-failure probability problems using active learning method
Pijus Rajak, Pronab Roy
Probabilistic Engineering Mechanics (2024) Vol. 77, pp. 103662-103662
Closed Access | Times Cited: 1
Pijus Rajak, Pronab Roy
Probabilistic Engineering Mechanics (2024) Vol. 77, pp. 103662-103662
Closed Access | Times Cited: 1
A Novel Active-Learning Kriging Reliability Analysis Method Based on Parallelized Sampling Considering Budget Allocation
Yushuai Che, Yan Ma, Yongxiang Li, et al.
IEEE Transactions on Reliability (2023) Vol. 73, Iss. 1, pp. 589-601
Closed Access | Times Cited: 2
Yushuai Che, Yan Ma, Yongxiang Li, et al.
IEEE Transactions on Reliability (2023) Vol. 73, Iss. 1, pp. 589-601
Closed Access | Times Cited: 2