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OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images
Francisco López de la Rosa, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, et al.
Applied Sciences (2021) Vol. 11, Iss. 20, pp. 9508-9508
Open Access | Times Cited: 32

Showing 1-25 of 32 citing articles:

Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network
Francisco López de la Rosa, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, et al.
Expert Systems with Applications (2022) Vol. 206, pp. 117731-117731
Closed Access | Times Cited: 52
Properties and Characterization Techniques of Graphene Modified Asphalt Binders
Rodrigo Polo-Mendoza, Tatiana Navarro-Donado, Daniela Ortega-Martinez, et al.
Nanomaterials (2023) Vol. 13, Iss. 5, pp. 955-955
Open Access | Times Cited: 38
Mineral Characterization Using Scanning Electron Microscopy (SEM): A Review of the Fundamentals, Advancements, and Research Directions
Asif Ali, Ning Zhang, Rafael M. Santos
Applied Sciences (2023) Vol. 13, Iss. 23, pp. 12600-12600
Open Access | Times Cited: 36
Automatic Identification of Surface Defects in Semiconductor Materials Based on Machine Learning
Huan Li
Applied Mathematics and Nonlinear Sciences (2025) Vol. 10, Iss. 1
Open Access
Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network
Francisco López de la Rosa, José L. Gómez-Sirvent, Rafael Morales, et al.
Computers & Industrial Engineering (2023) Vol. 183, pp. 109549-109549
Closed Access | Times Cited: 14
CFNet: Cross-modal data augmentation empowered fuzzy neural network for spectral fluctuation
Aojun Gong, Weihua Huang, Yongkai Xiao, et al.
Knowledge-Based Systems (2024) Vol. 304, pp. 112450-112450
Closed Access | Times Cited: 4
Optimal Feature Selection for Defect Classification in Semiconductor Wafers
José L. Gómez-Sirvent, Francisco López de la Rosa, Roberto Sánchez-Reolid, et al.
IEEE Transactions on Semiconductor Manufacturing (2022) Vol. 35, Iss. 2, pp. 324-331
Closed Access | Times Cited: 21
Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers
Yue Song, Zhiyong Lv, Jiaming Bai, et al.
Crystals (2022) Vol. 12, Iss. 6, pp. 765-765
Open Access | Times Cited: 19
An Expandable Yield Prediction Framework Using Explainable Artificial Intelligence for Semiconductor Manufacturing
Youjin Lee, Yonghan Roh
Applied Sciences (2023) Vol. 13, Iss. 4, pp. 2660-2660
Open Access | Times Cited: 11
A survey on machine and deep learning in semiconductor industry: methods, opportunities, and challenges
An Chi Huang, Sheng Hui Meng, Tian Jiun Huang
Cluster Computing (2023) Vol. 26, Iss. 6, pp. 3437-3472
Closed Access | Times Cited: 8
The use of electron microscopy for lithiasis research
Naima Mammate, Salim Belchkar, Salma Ssouni, et al.
IntechOpen eBooks (2024)
Open Access | Times Cited: 2
Kinodynamic Generation of Wafer Scanners Trajectories Used in Semiconductor Manufacturing
Yazan M. Al-Rawashdeh, Mohammad Al Janaideh, Marcel Heertjes
IEEE Transactions on Automation Science and Engineering (2022) Vol. 20, Iss. 1, pp. 718-732
Open Access | Times Cited: 10
Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5
Bappaditya Dey, Enrique Dehaerne, Sandip Halder
(2022), pp. 11-11
Closed Access | Times Cited: 9
A Comparative Study of State-of-the-Art Deep Learning Models for Semantic Segmentation of Pores in Scanning Electron Microscope Images of Activated Carbon
Bishwas Pokharel, Deep Shankar Pandey, Anjuli Sapkota, et al.
IEEE Access (2024) Vol. 12, pp. 50217-50243
Open Access | Times Cited: 1
Improved Surface Defect Classification from a Simple Convolutional Neural Network by Image Preprocessing and Data Augmentation
Francisco López de la Rosa, Lucía Moreno-Salvador, José L. Gómez-Sirvent, et al.
Lecture notes in computer science (2024), pp. 23-32
Closed Access | Times Cited: 1
Morphological analysis of Pd/C nanoparticles using SEM imaging and advanced deep learning
Nguyễn Đức Thuận, Hoang Manh Cuong, Nguyen Hoang Nam, et al.
RSC Advances (2024) Vol. 14, Iss. 47, pp. 35172-35183
Open Access | Times Cited: 1
Defect classification on semiconductor wafers using Fisher vector and visual vocabularies coding
José L. Gómez-Sirvent, Francisco López de la Rosa, Roberto Sánchez-Reolid, et al.
Measurement (2022) Vol. 202, pp. 111872-111872
Closed Access | Times Cited: 8
A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets
Francisco López de la Rosa, José L. Gómez-Sirvent, Rafael Morales, et al.
Applied Soft Computing (2022) Vol. 131, pp. 109743-109743
Closed Access | Times Cited: 8
Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model
Rajesh Doss, Jayabrabu Ramakrishnan, S. Kavitha, et al.
Advances in Materials Science and Engineering (2022) Vol. 2022, pp. 1-12
Open Access | Times Cited: 7
Enhanced Deep Convolutional Neural Network for Identifying and Classification of Silicon Wafer Faults in IC Fabrication Industries
G. Challa Ram, M. V. Subbarao, Disha Varma, et al.
(2023), pp. 1-6
Closed Access | Times Cited: 3
Deep Learning Based Visual Recognition for Inline Defects in Production of Semiconductors
Khouloud Limam, Shahzad Cheema, S. Mouhoubi, et al.
IEEE Journal of Emerging and Selected Topics in Industrial Electronics (2023) Vol. 5, Iss. 1, pp. 203-211
Closed Access | Times Cited: 3
Machine Learning on Multiplexed Optical Metrology Pattern Shift Response Targets to Predict Electrical Properties
Thomas J. Ashby, Vincent Truffert, Dorin Cerbu, et al.
IEEE Transactions on Semiconductor Manufacturing (2023) Vol. 37, Iss. 1, pp. 46-58
Open Access | Times Cited: 3
Ultrathin silicon wafer defect detection method based on IR micro-digital holography
B. Lai, Yongan Zhang, Changxing Zhang
Applied Optics (2023) Vol. 62, Iss. 15, pp. 4040-4040
Closed Access | Times Cited: 2
Recognizing Microwave Field Contrast of Invisible Microstrip Defects With High Accuracy by Quantum Wide-Field Microscope
Huan Fei Wen, Y. W. Jin, Ding Wang, et al.
IEEE Transactions on Microwave Theory and Techniques (2024) Vol. 72, Iss. 10, pp. 5896-5903
Closed Access
Difference Image-Based Training Sets for Automatic Defect Classification at Outgoing Inspection
Mark Sidorchuk, Nigel Caprotti, Mert Kilicoglu, et al.
(2024) Vol. 12, pp. 01-05
Closed Access
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