
OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
Dynamic ellipsometry measurement based on a simplified phase-stable dual-comb system
Ruixue Zhang, Liheng Shi, Siyu Zhou, et al.
Optics Express (2022) Vol. 30, Iss. 5, pp. 7806-7806
Open Access | Times Cited: 9
Ruixue Zhang, Liheng Shi, Siyu Zhou, et al.
Optics Express (2022) Vol. 30, Iss. 5, pp. 7806-7806
Open Access | Times Cited: 9
Showing 9 citing articles:
Metasurface array for single-shot spectroscopic ellipsometry
Shun Wen, Xinyuan Xue, Shuai Wang, et al.
Light Science & Applications (2024) Vol. 13, Iss. 1
Open Access | Times Cited: 16
Shun Wen, Xinyuan Xue, Shuai Wang, et al.
Light Science & Applications (2024) Vol. 13, Iss. 1
Open Access | Times Cited: 16
Phase‐Stable Multidimensional Coherent Spectroscopy Based on Dual‐Comb Interferometry
Zhong Zuo, Chenglin Gu, Siyi Wang, et al.
Advanced Optical Materials (2024) Vol. 12, Iss. 16
Closed Access | Times Cited: 2
Zhong Zuo, Chenglin Gu, Siyi Wang, et al.
Advanced Optical Materials (2024) Vol. 12, Iss. 16
Closed Access | Times Cited: 2
Integer-locking condition for stable dual-comb interferometry in situations with fluctuating frequency-comb repetition rates
R. Shibata, Shun Fujii, Shinichi Watanabe
Optics Express (2024) Vol. 32, Iss. 10, pp. 17373-17373
Open Access | Times Cited: 2
R. Shibata, Shun Fujii, Shinichi Watanabe
Optics Express (2024) Vol. 32, Iss. 10, pp. 17373-17373
Open Access | Times Cited: 2
High-precision surface profilometry on a micron-groove based on dual-comb electronically controlled optical sampling
Ziling Wu, Ameng Li, Rui Xue, et al.
Applied Optics (2023) Vol. 62, Iss. 33, pp. 8793-8793
Closed Access | Times Cited: 5
Ziling Wu, Ameng Li, Rui Xue, et al.
Applied Optics (2023) Vol. 62, Iss. 33, pp. 8793-8793
Closed Access | Times Cited: 5
High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry
Shuncong Zhong, Ren-Yu He, Yaosen Deng, et al.
Photonics (2024) Vol. 11, Iss. 5, pp. 422-422
Open Access
Shuncong Zhong, Ren-Yu He, Yaosen Deng, et al.
Photonics (2024) Vol. 11, Iss. 5, pp. 422-422
Open Access
Jones-Matrix Dual-Comb Spectroscopic Polarimetry
Hidenori Koresawa, Hiroki Kitahama, Eiji Hase, et al.
(2024) Vol. 416, pp. SM1G.7-SM1G.7
Closed Access
Hidenori Koresawa, Hiroki Kitahama, Eiji Hase, et al.
(2024) Vol. 416, pp. SM1G.7-SM1G.7
Closed Access
Photon-counting phase-stabilized dual-comb ranging
Yingyu Liu, Wei Zhong, Chong Wang, et al.
Optics Express (2024) Vol. 32, Iss. 19, pp. 34105-34105
Open Access
Yingyu Liu, Wei Zhong, Chong Wang, et al.
Optics Express (2024) Vol. 32, Iss. 19, pp. 34105-34105
Open Access
Method for Extracting Optical Element Information Using Optical Coherence Tomography
Jiucheng Nie, Yukun Wang, Dacheng Wang, et al.
Sensors (2024) Vol. 24, Iss. 21, pp. 6953-6953
Open Access
Jiucheng Nie, Yukun Wang, Dacheng Wang, et al.
Sensors (2024) Vol. 24, Iss. 21, pp. 6953-6953
Open Access
Spectral interference ellipsometry for film thickness measurement on transparent substrate
Jinxu Zhang, Liheng Shi, Ruixue Zhang, et al.
Optics and Lasers in Engineering (2023) Vol. 171, pp. 107819-107819
Closed Access | Times Cited: 1
Jinxu Zhang, Liheng Shi, Ruixue Zhang, et al.
Optics and Lasers in Engineering (2023) Vol. 171, pp. 107819-107819
Closed Access | Times Cited: 1