
OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
YOLO-HMC: An Improved Method for PCB Surface Defect Detection
Minghao Yuan, Yongbing Zhou, Xiaoyu Ren, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-11
Closed Access | Times Cited: 23
Minghao Yuan, Yongbing Zhou, Xiaoyu Ren, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-11
Closed Access | Times Cited: 23
Showing 23 citing articles:
Lightweight and Efficient Tiny-Object Detection Based on Improved YOLOv8n for UAV Aerial Images
Min Yue, Liqiang Zhang, Juan Huang, et al.
Drones (2024) Vol. 8, Iss. 7, pp. 276-276
Open Access | Times Cited: 13
Min Yue, Liqiang Zhang, Juan Huang, et al.
Drones (2024) Vol. 8, Iss. 7, pp. 276-276
Open Access | Times Cited: 13
A Lightweight and Enhanced YOLO11-Based Method for Small Object Surface Defect Detection
He Rao, Hongfei Zhan, Rui Wang, et al.
Research Square (Research Square) (2025)
Closed Access
He Rao, Hongfei Zhan, Rui Wang, et al.
Research Square (Research Square) (2025)
Closed Access
A lightweight and high-accuracy framework for Printed Circuit Board defect detection
Yunyun Hou, Xindong Zhang
Engineering Applications of Artificial Intelligence (2025) Vol. 148, pp. 110375-110375
Closed Access
Yunyun Hou, Xindong Zhang
Engineering Applications of Artificial Intelligence (2025) Vol. 148, pp. 110375-110375
Closed Access
A novel PCB surface defect detection method based on separated global context attention to guide residual context aggregation
Lingyun Zhu, Rui Zhao
Scientific Reports (2025) Vol. 15, Iss. 1
Open Access
Lingyun Zhu, Rui Zhao
Scientific Reports (2025) Vol. 15, Iss. 1
Open Access
MAFF-Net: PCB defect detection via feature-enhancement fusion
Jian Chen, Shouyin Wang, Ziyuan Chen, et al.
Measurement Science and Technology (2025) Vol. 36, Iss. 2, pp. 026137-026137
Closed Access
Jian Chen, Shouyin Wang, Ziyuan Chen, et al.
Measurement Science and Technology (2025) Vol. 36, Iss. 2, pp. 026137-026137
Closed Access
SF-YOLO: designed based on tiny feature for PCB surface defect detection and deployment in embedded systems
Kaikai Zhang, Yanyan Wang, Shengzhe Shi, et al.
Signal Image and Video Processing (2025) Vol. 19, Iss. 3
Closed Access
Kaikai Zhang, Yanyan Wang, Shengzhe Shi, et al.
Signal Image and Video Processing (2025) Vol. 19, Iss. 3
Closed Access
A chip X-ray image bubble defect detection model combined with Dual-Former attention mechanism
Ang Li, Raseeda Hamzah, Siti Khatijah Nor Abdu Rahim
Measurement (2025), pp. 116871-116871
Closed Access
Ang Li, Raseeda Hamzah, Siti Khatijah Nor Abdu Rahim
Measurement (2025), pp. 116871-116871
Closed Access
Lightweight intelligent detection algorithm for surface defects in printed circuit board
Xiaolong Zhao, Haifeng Zhang, Chonghui Song, et al.
Computers & Industrial Engineering (2025), pp. 111030-111030
Closed Access
Xiaolong Zhao, Haifeng Zhang, Chonghui Song, et al.
Computers & Industrial Engineering (2025), pp. 111030-111030
Closed Access
YOLO-RRL: A Lightweight Algorithm for PCB Surface Defect Detection
Tian Zhang, Jie Zhang, Pengfei Pan, et al.
Applied Sciences (2024) Vol. 14, Iss. 17, pp. 7460-7460
Open Access | Times Cited: 2
Tian Zhang, Jie Zhang, Pengfei Pan, et al.
Applied Sciences (2024) Vol. 14, Iss. 17, pp. 7460-7460
Open Access | Times Cited: 2
A Comprehensive Study of Open-Source Printed Circuit Board (PCB) Design Software Bugs
Xu Zhao, He Jiang, Shikai Guo, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-16
Closed Access | Times Cited: 2
Xu Zhao, He Jiang, Shikai Guo, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-16
Closed Access | Times Cited: 2
Reliable and Lightweight Adaptive Convolution Network for PCB Surface Defect Detection
Lei Lei, Han‐Xiong Li, Haidong Yang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-8
Closed Access | Times Cited: 1
Lei Lei, Han‐Xiong Li, Haidong Yang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-8
Closed Access | Times Cited: 1
Flexible Material Quality Assessment Based on Visual–Tactile Fusion
Shuchang Xu, Haohao Xu, Fangtao Mao, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-10
Closed Access | Times Cited: 1
Shuchang Xu, Haohao Xu, Fangtao Mao, et al.
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 73, pp. 1-10
Closed Access | Times Cited: 1
Improved Real Time Printed Circuit Board Fault Detection
Abdelhak Mehadjbia, Fouad Slaoui-Hasnaoui
(2024), pp. 1-6
Closed Access
Abdelhak Mehadjbia, Fouad Slaoui-Hasnaoui
(2024), pp. 1-6
Closed Access
Defect detection of Printed circuit board Surface based on an improved YOLOv8 with FasterNet backbone algorithms
Li‐Juan Liu, Liang Yu, Hamid Reza Karimic
Research Square (Research Square) (2024)
Open Access
Li‐Juan Liu, Liang Yu, Hamid Reza Karimic
Research Square (Research Square) (2024)
Open Access
An Improved YOLOv9 and Its Applications for Detecting Flexible Circuit Boards Connectors
Guohe Huang, Yeqing Huang, Haoyang Li, et al.
International Journal of Computational Intelligence Systems (2024) Vol. 17, Iss. 1
Open Access
Guohe Huang, Yeqing Huang, Haoyang Li, et al.
International Journal of Computational Intelligence Systems (2024) Vol. 17, Iss. 1
Open Access
Comparison of Preprocessing Method Impact on the Detection of Soldering Splashes Using Different YOLOv8 Versions
Peter Klčo, Dušan Koniar, Libor Hargaš, et al.
Computation (2024) Vol. 12, Iss. 11, pp. 225-225
Open Access
Peter Klčo, Dušan Koniar, Libor Hargaš, et al.
Computation (2024) Vol. 12, Iss. 11, pp. 225-225
Open Access
Surface Defect Detection of Cigarette Packs Based on Improved YOLOv8
Peng Dong, Di Wang, Yongsheng Wang, et al.
2022 7th International Conference on Intelligent Computing and Signal Processing (ICSP) (2024), pp. 1745-1749
Closed Access
Peng Dong, Di Wang, Yongsheng Wang, et al.
2022 7th International Conference on Intelligent Computing and Signal Processing (ICSP) (2024), pp. 1745-1749
Closed Access
MDD-DETR: Lightweight Detection Algorithm for Printed Circuit Board Minor Defects
Jinmin Peng, Weipeng Fan, Song Lan, et al.
Electronics (2024) Vol. 13, Iss. 22, pp. 4453-4453
Open Access
Jinmin Peng, Weipeng Fan, Song Lan, et al.
Electronics (2024) Vol. 13, Iss. 22, pp. 4453-4453
Open Access
An Optimization Method for PCB Surface Defect Detection Model Based on Measurement of Defect Characteristics and Backbone Network Feature Information
Huixiang Liu, Xin Zhao, Qiong Liu, et al.
Sensors (2024) Vol. 24, Iss. 22, pp. 7373-7373
Open Access
Huixiang Liu, Xin Zhao, Qiong Liu, et al.
Sensors (2024) Vol. 24, Iss. 22, pp. 7373-7373
Open Access
Discrete Wavelet Transform Based Detection Transformer for Battery Weld Defect Detection
Kang Zhang, L. Z. Liao, Yonghua Wang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 74, pp. 1-11
Closed Access
Kang Zhang, L. Z. Liao, Yonghua Wang
IEEE Transactions on Instrumentation and Measurement (2024) Vol. 74, pp. 1-11
Closed Access
Defect detection of printed circuit board surface based on an improved YOLOv8 with FasterNet backbone algorithms
Lijuan Liu, Yu Zhang, Hamid Reza Karimi
Signal Image and Video Processing (2024) Vol. 19, Iss. 1
Closed Access
Lijuan Liu, Yu Zhang, Hamid Reza Karimi
Signal Image and Video Processing (2024) Vol. 19, Iss. 1
Closed Access
PCB defect detection based on pseudo-inverse transformation and YOLOv5
Xiaoli Wang, Siti Sarah Maidin, Malathy Batumalay
PLoS ONE (2024) Vol. 19, Iss. 12, pp. e0315424-e0315424
Open Access
Xiaoli Wang, Siti Sarah Maidin, Malathy Batumalay
PLoS ONE (2024) Vol. 19, Iss. 12, pp. e0315424-e0315424
Open Access
YOLOv8-DEE: a high-precision model for printed circuit board defect detection
Feifan Yi, Ahmad Sufril Azlan Mohamed, Mohd Halim Mohd Noor, et al.
PeerJ Computer Science (2024) Vol. 10, pp. e2548-e2548
Open Access
Feifan Yi, Ahmad Sufril Azlan Mohamed, Mohd Halim Mohd Noor, et al.
PeerJ Computer Science (2024) Vol. 10, pp. e2548-e2548
Open Access