OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples
He Zhao, Jinhai Liu, Jianhua Tang, et al.
IEEE Transactions on Instrumentation and Measurement (2022) Vol. 72, pp. 1-10
Closed Access | Times Cited: 16

Showing 16 citing articles:

Steel surface defect detection based on self-supervised contrastive representation learning with matching metric
Xuejin Hu, Jing Yang, Fengling Jiang, et al.
Applied Soft Computing (2023) Vol. 145, pp. 110578-110578
Closed Access | Times Cited: 19

KD-LightNet: A Lightweight Network Based on Knowledge Distillation for Industrial Defect Detection
Jinhai Liu, Hengguang Li, Fengyuan Zuo, et al.
IEEE Transactions on Instrumentation and Measurement (2023) Vol. 72, pp. 1-13
Closed Access | Times Cited: 19

SSCT-Net: A Semisupervised Circular Teacher Network for Defect Detection With Limited Labeled Multiview MFL Samples
Xiangkai Shen, Jinhai Liu, Jiayue Sun, et al.
IEEE Transactions on Industrial Informatics (2023) Vol. 19, Iss. 10, pp. 10114-10124
Closed Access | Times Cited: 18

A Dynamic Weights-Based Wavelet Attention Neural Network for Defect Detection
Jinhai Liu, He Zhao, Zhaolin Chen, et al.
IEEE Transactions on Neural Networks and Learning Systems (2023) Vol. 35, Iss. 11, pp. 16211-16221
Closed Access | Times Cited: 16

An X-Ray-Based Automatic Welding Defect Detection Method for Special Equipment System
Fengyuan Zuo, Jinhai Liu, Zhao Xiang, et al.
IEEE/ASME Transactions on Mechatronics (2023) Vol. 29, Iss. 3, pp. 2241-2252
Closed Access | Times Cited: 13

A classification and quantitative assessment method for internal and external surface defects in pipelines based on ASTC-Net
Jie Yuan, Mengtian Qiao, Chun Hu, et al.
Advanced Engineering Informatics (2024) Vol. 61, pp. 102492-102492
Closed Access | Times Cited: 5

Lightweight intelligent detection algorithm for surface defects in printed circuit board
Xiaolong Zhao, Haifeng Zhang, Chonghui Song, et al.
Computers & Industrial Engineering (2025), pp. 111030-111030
Closed Access

A Highly Efficient and Lightweight Detection Method for Steel Surface Defect
Changyu Xu, Jie Li, Xianguo Li
Journal of Nondestructive Evaluation (2024) Vol. 43, Iss. 3
Closed Access | Times Cited: 2

An Accurate and Explainable Residuum Inspection Network with Residual Block Connection and Hybrid Attention Fusion
Yanqin Ma, Wei Hou, Yonghua Xie, et al.
IEEE Sensors Journal (2024) Vol. 24, Iss. 19, pp. 30500-30511
Closed Access

A novel anomaly detection method for magnetic flux leakage signals via a feature-based unsupervised detection network
He Zhao, Jinhai Liu, Qiannan Wang, et al.
Computers in Industry (2024) Vol. 164, pp. 104190-104190
Closed Access

A Novel Multi-Fidelity Gaussian Process Regression Approach for Defect Characterization in Motion-Induced Eddy Current Testing
Xuhui Huang, Zi Li, Lei Peng, et al.
NDT & E International (2024), pp. 103274-103274
Closed Access

Improved YOLOv5-Based Method for Tiny Defect Detection on Steel Plate
Jiwei Yu, Zhihang Ji, Yu Yang, et al.
(2024)
Closed Access

A Lightweight Pipeline Defect Detection Method via Structural Reparameterization Technique and Ghost Convolution
Zhitao Wen, Jinhai Liu, Xiangkai Shen, et al.
2022 IEEE 11th Data Driven Control and Learning Systems Conference (DDCLS) (2023), pp. 723-727
Closed Access

A Method based on Feature Reuse and Structure Re-parameterization for Magnetic Flux Leakage Defect Detection
Qiannan Wang, Jinhai Liu, He Zhao, et al.
2022 4th International Conference on Industrial Artificial Intelligence (IAI) (2023)
Closed Access

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