OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

A Novel Hybrid Transfer Learning Approach for Small-Sample High-Voltage Circuit Breaker Fault Diagnosis On-site
Yanxin Wang, Jing Yan, Jinhua Wang, et al.
IEEE Transactions on Industry Applications (2023), pp. 1-9
Closed Access | Times Cited: 5

Showing 5 citing articles:

Novel Meta-Learning for Few-Shot Bearing Fault Diagnosis Under Varying Working Conditions
Chuanhao Wang, Jigang Peng, Yongjian Sun
Engineering Research Express (2024) Vol. 6, Iss. 3, pp. 035239-035239
Closed Access | Times Cited: 2

Few-Shot Mechanical Fault Diagnosis for a High-Voltage Circuit Breaker via a Transformer–Convolutional Neural Network and Metric Meta-Learning
Jing Yan, Yanxin Wang, Zhou Yang, et al.
IEEE Transactions on Instrumentation and Measurement (2023) Vol. 72, pp. 1-11
Closed Access | Times Cited: 6

Fault Diagnosis of Universal Circuit Breakers Based on Variational Mode Decomposition and WOA-DBN
Guorui Liu, Xinyang Cheng, Hualin Dai, et al.
Applied Sciences (2024) Vol. 14, Iss. 11, pp. 4928-4928
Open Access | Times Cited: 1

Mechanical fault diagnosis of high voltage circuit breaker using multimodal data fusion
Tianhui Li, Yanwei Xia, Xianhai Pang, et al.
PeerJ Computer Science (2024) Vol. 10, pp. e2248-e2248
Open Access | Times Cited: 1

A Transfer-Learning-Based Fault Detection Approach for Nonlinear Industrial Processes Under Unusual Operating Conditions
Linlin Li, X. Z. Chen, Xin Peng, et al.
IEEE Transactions on Industrial Informatics (2023) Vol. 20, Iss. 4, pp. 5374-5382
Closed Access | Times Cited: 3

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