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OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

MicroCrack-Net: A Deep Neural Network With Outline Profile-Guided Feature Augmentation and Attention-Based Multiscale Fusion for MicroCrack Detection of Tantalum Capacitors
Mingyang Cheng, Chuqiao Xu, Junliang Wang, et al.
IEEE Transactions on Aerospace and Electronic Systems (2022) Vol. 58, Iss. 6, pp. 5141-5152
Closed Access | Times Cited: 14

Showing 14 citing articles:

Deep Learning and Image data-based surface cracks recognition of laser nitrided Titanium alloy
Muhammad Rizwan Awan, Chi-Wai Chan, Adrian Murphy, et al.
Results in Engineering (2024) Vol. 22, pp. 102003-102003
Open Access | Times Cited: 14
A dual encoder crack segmentation network with Haar wavelet-based high-low frequency attention
Jianming Zhang, Zhigao Zeng, Pradip Kumar Sharma, et al.
Expert Systems with Applications (2024) Vol. 256, pp. 124950-124950
Closed Access | Times Cited: 9
PA-DETR: End-to-End Visually Indistinguishable Bolt Defects Detection Method Based on Transmission Line Knowledge Reasoning
Ke Zhang, Wenshuo Lou, Jiacun Wang, et al.
IEEE Transactions on Instrumentation and Measurement (2023) Vol. 72, pp. 1-14
Closed Access | Times Cited: 17
Automatic detection of surface defects based on deep random chains
Tan Zhang, Zihe Wang, Fengwei Li, et al.
Expert Systems with Applications (2023) Vol. 229, pp. 120472-120472
Closed Access | Times Cited: 16
Knowledge augmented broad learning system for computer vision based mixed-type defect detection in semiconductor manufacturing
Junliang Wang, Pengjie Gao, Jie Zhang, et al.
Robotics and Computer-Integrated Manufacturing (2022) Vol. 81, pp. 102513-102513
Closed Access | Times Cited: 25
A hierarchical training-convolutional neural network with feature alignment for steel surface defect recognition
Yiping Gao, Liang Gao, Xinyu Li
Robotics and Computer-Integrated Manufacturing (2022) Vol. 81, pp. 102507-102507
Closed Access | Times Cited: 20
Causal deep learning for explainable vision-based quality inspection under visual interference
Tianbiao Liang, Tianyuan Liu, Junliang Wang, et al.
Journal of Intelligent Manufacturing (2024)
Closed Access | Times Cited: 4
Brain-Inspired Interpretable Network Pruning for Smart Vision-Based Defect Detection Equipment
Junliang Wang, Shuxuan Zhao, Chuqiao Xu, et al.
IEEE Transactions on Industrial Informatics (2022) Vol. 19, Iss. 2, pp. 1666-1673
Closed Access | Times Cited: 15
Deep-learning based artificial intelligence tool for melt pools and defect segmentation
Amra Peles, Vincent Paquit, Ryan Dehoff
Journal of Intelligent Manufacturing (2024)
Closed Access | Times Cited: 1
An Assessment of Human Inspection and Deep Learning for Defect Identification in Floral Wreaths
Diego Caballero-Ramirez, Yolanda Báez-López, Jorge Limón-Romero, et al.
Horticulturae (2023) Vol. 9, Iss. 11, pp. 1213-1213
Open Access | Times Cited: 3
Multiresolution SAR Target Recognition Based on Physical Attention Enhancement and Scale Distillation
Longfei Wang, Yanbo Yang, Zhunga Liu
IEEE Transactions on Aerospace and Electronic Systems (2024) Vol. 60, Iss. 3, pp. 3081-3094
Closed Access
The WIPI Model Based on Multi-Scale Local Contrast Post-Processing for Infrared Small Target Detection
Juan Chen, Lin Qiu, Zhencai Zhu, et al.
Canadian Journal of Remote Sensing (2024) Vol. 50, Iss. 1
Open Access
A Two-Stage Focal Transformer for Human–Robot Collaboration-Based Surface Defect Inspection
Yiping Gao, Liang Gao, Xinyu Li
Journal of Manufacturing Science and Engineering (2023) Vol. 145, Iss. 12
Closed Access | Times Cited: 1
Causal inference-guided deep learning method for vision-based defect detection of complex patterned fabrics
Tianbiao Liang, Tianyuan Liu, Junliang Wang, et al.
Scientia Sinica Technologica (2023) Vol. 53, Iss. 7, pp. 1138-1149
Closed Access
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