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OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

An incipient fault diagnosis method based on Att-GCN for analogue circuits
Jingli Yang, Ye Li, Tianyu Gao
Measurement Science and Technology (2022) Vol. 34, Iss. 4, pp. 045002-045002
Closed Access | Times Cited: 9

Showing 9 citing articles:

Spatial-temporal graph feature learning driven by time–frequency similarity assessment for robust fault diagnosis of rotating machinery
Lei Wang, Fuchen Xie, Xin Zhang, et al.
Advanced Engineering Informatics (2024) Vol. 62, pp. 102711-102711
Closed Access | Times Cited: 6
An Exploration into the Fault Diagnosis of Analog Circuits Using Enhanced Golden Eagle Optimized 1D-Convolutional Neural Network (CNN) with a Time-Frequency Domain Input and Attention Mechanism
Jiyuan Gao, Jiang Guo, Fang Yuan, et al.
Sensors (2024) Vol. 24, Iss. 2, pp. 390-390
Open Access | Times Cited: 4
Soft fault diagnosis in linear circuits: Test selection and non-iterative identification procedure
Stanisław Hałgas
Measurement (2023) Vol. 217, pp. 113061-113061
Open Access | Times Cited: 5
A dual-view network for fault diagnosis in rotating machinery using unbalanced data
Zixu Chen, Wennian Yu, Chengcheng Kong, et al.
Measurement Science and Technology (2023) Vol. 34, Iss. 11, pp. 115107-115107
Closed Access | Times Cited: 5
A Novel Incipient Fault Diagnosis Method for Analogue Circuits Based on an MLDLCN
Xiaodong Liu, Haochi Yang, Tianyu Gao, et al.
Circuits Systems and Signal Processing (2023) Vol. 43, Iss. 2, pp. 684-710
Closed Access | Times Cited: 2
Diagnosis of Analog Circuits: The Problem of Ambiguity of Test Equation Solutions
Stanisław Hałgas
Electronics (2024) Vol. 13, Iss. 4, pp. 684-684
Open Access
Investigation of Cu-Sn-Sb Thin Film for Ultra-Speed and Phase High-Reliability Change Memory Applications
Haipeng You, Y. Chen, Yue Li, et al.
ECS Journal of Solid State Science and Technology (2024) Vol. 13, Iss. 5, pp. 053002-053002
Closed Access
Design of the bandgap reference circuit based on deep learning
Hui Li, Jue Wang, Xianfeng Sun, et al.
(2024), pp. 334-334
Closed Access
Knowledge-data-driven process monitoring based on temporal knowledge graphs and supervised contrastive learning for complex industrial processes
Kaixiang Peng, Jianhua Chen, Hui Yang, et al.
Journal of Process Control (2024) Vol. 141, pp. 103283-103283
Closed Access
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