OpenAlex Citation Counts

OpenAlex Citations Logo

OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

A fast oxidation region detection algorithm based on differential geometry approach for high-density flexible integrated circuit packaging substrates
Zhiyan Zhong, Yueming Hu
Measurement Science and Technology (2018) Vol. 29, Iss. 10, pp. 105401-105401
Closed Access | Times Cited: 6

Showing 6 citing articles:

A Novel Defect Detection Algorithm for Flexible Integrated Circuit Package Substrates
Zhiyan Zhong, Zhichao Ma
IEEE Transactions on Industrial Electronics (2021) Vol. 69, Iss. 2, pp. 2117-2126
Closed Access | Times Cited: 33

Sensing High-Density IC Substrates: Adaptive Fractional Differentiation for Accurate Image Segmentation
Yongxing Yu, Dan Huang, Yueming Hu, et al.
IEEE Sensors Journal (2024) Vol. 24, Iss. 19, pp. 30619-30634
Closed Access

HDTNet: PCB defect detection algorithm for tiny objects of high-density regions
Yunzhi Li, Jingsheng Lei, Wenbin Shi, et al.
Journal of Intelligent & Fuzzy Systems (2023) Vol. 46, Iss. 1, pp. 1531-1541
Closed Access | Times Cited: 1

A novel solder joint diagnosis algorithm using differential geometry approach in high-density flexible integrated circuit substrates
Yong Zeng, Yueming Hu, Dan Huang
Measurement Science and Technology (2021) Vol. 32, Iss. 7, pp. 075405-075405
Closed Access | Times Cited: 2

A novel solder joints inspection method using curvature and geometry features in high-density flexible IC substrates surface mount technology
Yong Zeng, Yueming Hu, Xiaohan Zhang, et al.
Physica Scripta (2021) Vol. 96, Iss. 12, pp. 125528-125528
Closed Access | Times Cited: 1

A differential geometry-based method for detecting etching defects in high-density interconnect IC substrates
Perman Yu, Dan Huang, Hongcheng Zhou, et al.
(2023), pp. 23-23
Closed Access

Page 1

Scroll to top