OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

Interface failure behavior and mechanisms of 4H-SiC wafer with alloy backside layer caused by different dicing technologies
Meina Qu, Yi Zhang, Chuanzhen Huang
Journal of Manufacturing Processes (2024) Vol. 120, pp. 1115-1123
Closed Access | Times Cited: 5

Showing 5 citing articles:

Brittle-ductile transition mechanism during grinding 4H-SiC wafer considering laminated structure
Meina Qu, Chuanzhen Huang, Shuiquan Huang, et al.
International Journal of Mechanical Sciences (2024) Vol. 283, pp. 109685-109685
Closed Access | Times Cited: 6

Intelligent recognition method for material removal mode during high-quality ground surface of RB-SiC ceramics based on YOLOv8-Slim-Neck-Ca model
Rong Wang, Zhenzhong Zhang, Guozhao Wei, et al.
Nondestructive Testing And Evaluation (2025), pp. 1-21
Closed Access

A State-of-the-Art Review of Fracture Toughness of Silicon Carbide: Implications for High-Precision Laser Dicing Techniques
Zhiqiang Fan, Jiaxin Zhang, Zhirong Wang, et al.
Processes (2024) Vol. 12, Iss. 12, pp. 2696-2696
Open Access | Times Cited: 1

Thermal defects generation mechanism in laser precision dressing of metal-bonded micro-groove diamond wheel and their influence on grinding silicon wafer
Fengrong Luo, Wei Zhou, Zhenpeng Zhong, et al.
Optics & Laser Technology (2024) Vol. 182, pp. 112046-112046
Closed Access

Impact of material anisotropy on ultrafast laser dicing of SiC wafers for enhancing efficiency and quality
Rui Gao, Chunjin Wang, Qixian Zhang, et al.
Optics & Laser Technology (2024) Vol. 183, pp. 112358-112358
Closed Access

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