OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
An efficient method for faults diagnosis in analog circuits based on machine learning classifiers
Abderrazak Arabi, Mouloud Ayad, Nacerdine Bourouba, et al.
Alexandria Engineering Journal (2023) Vol. 77, pp. 109-125
Open Access | Times Cited: 14
Abderrazak Arabi, Mouloud Ayad, Nacerdine Bourouba, et al.
Alexandria Engineering Journal (2023) Vol. 77, pp. 109-125
Open Access | Times Cited: 14
Showing 14 citing articles:
Intermittent fault diagnosis for electronics-rich analog circuit systems based on multi-scale enhanced convolution transformer network with novel token fusion strategy
Shengdong Wang, Zhenbao Liu, Zhen Jia, et al.
Expert Systems with Applications (2023) Vol. 238, pp. 121964-121964
Closed Access | Times Cited: 12
Shengdong Wang, Zhenbao Liu, Zhen Jia, et al.
Expert Systems with Applications (2023) Vol. 238, pp. 121964-121964
Closed Access | Times Cited: 12
Teaching machine learning by implementing automatic detection of pavement in bicycles rides using smartphone accelerometer data
Martin Hideki Mensch Maruyama, Carlos Eduardo de Souza
International Journal of Mechanical Engineering Education (2025)
Closed Access
Martin Hideki Mensch Maruyama, Carlos Eduardo de Souza
International Journal of Mechanical Engineering Education (2025)
Closed Access
A self-trained, low complexity method for detecting Faults in Analog Circuits
Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis Intzes, et al.
IEEE Transactions on Instrumentation and Measurement (2025) Vol. 74, pp. 1-13
Closed Access
Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis Intzes, et al.
IEEE Transactions on Instrumentation and Measurement (2025) Vol. 74, pp. 1-13
Closed Access
Fault Diagnosis in Analog Circuits Using Stacking Ensemble Machine Learning Approach
M. Singhal, Gufran Ahmad
Circuits Systems and Signal Processing (2025)
Closed Access
M. Singhal, Gufran Ahmad
Circuits Systems and Signal Processing (2025)
Closed Access
Intermittent fault diagnosis of analog circuit based on enhanced one-dimensional vision transformer and transfer learning strategy
Shengdong Wang, Zhenbao Liu, Zhen Jia, et al.
Engineering Applications of Artificial Intelligence (2023) Vol. 127, pp. 107281-107281
Closed Access | Times Cited: 10
Shengdong Wang, Zhenbao Liu, Zhen Jia, et al.
Engineering Applications of Artificial Intelligence (2023) Vol. 127, pp. 107281-107281
Closed Access | Times Cited: 10
Fault detection in analog electronic circuits using fuzzy inference systems and particle swarm optimization
M.I. Dieste-Velasco
Alexandria Engineering Journal (2024) Vol. 95, pp. 376-393
Open Access | Times Cited: 3
M.I. Dieste-Velasco
Alexandria Engineering Journal (2024) Vol. 95, pp. 376-393
Open Access | Times Cited: 3
ANNs Predicting Noisy Signals in Electronic Circuits: A Model Predicting the Signal Trend in Amplification Systems
Alessandro Massaro
AI (2024) Vol. 5, Iss. 2, pp. 533-549
Open Access | Times Cited: 2
Alessandro Massaro
AI (2024) Vol. 5, Iss. 2, pp. 533-549
Open Access | Times Cited: 2
An Auxiliary Classifier Generative Adversarial Network Based Fault Diagnosis for Analog Circuit
Yong-Qiang Zheng, Dongqing Wang
IEEE Access (2023) Vol. 11, pp. 86824-86833
Open Access | Times Cited: 3
Yong-Qiang Zheng, Dongqing Wang
IEEE Access (2023) Vol. 11, pp. 86824-86833
Open Access | Times Cited: 3
Analog Circuit Fault Classification Detection Based on Adam-CNN Models
Jiehao Li, Wenlong Wu, Jinghua Zhang, et al.
(2024), pp. 1-6
Closed Access
Jiehao Li, Wenlong Wu, Jinghua Zhang, et al.
(2024), pp. 1-6
Closed Access
Detecting and Classifying Parametric Faults in Analog Circuits Using an Optimized Attention Neural Networks
S. Karthi, K. Kavitha
Circuits Systems and Signal Processing (2024) Vol. 43, Iss. 9, pp. 5401-5437
Closed Access
S. Karthi, K. Kavitha
Circuits Systems and Signal Processing (2024) Vol. 43, Iss. 9, pp. 5401-5437
Closed Access
Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation
Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis Intzes, et al.
(2024), pp. 01-04
Closed Access
Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis Intzes, et al.
(2024), pp. 01-04
Closed Access
Normalized signature graph of analog circuits for fault classification using digital testing
Mohamed H. El-Mahlawy, Sherif Anas Mohamed Hamdy
Ain Shams Engineering Journal (2024) Vol. 15, Iss. 10, pp. 102965-102965
Open Access
Mohamed H. El-Mahlawy, Sherif Anas Mohamed Hamdy
Ain Shams Engineering Journal (2024) Vol. 15, Iss. 10, pp. 102965-102965
Open Access
Analog Circuit Fault Diagnosis Based on Machine Learning Using Frequency Domain Features
S. Djordjevic
(2024), pp. 1-4
Closed Access
S. Djordjevic
(2024), pp. 1-4
Closed Access
Intelligent Analog Circuit Soft Fault Diagnosis Based on Multi-level SWT and EM-PCA
Xuanzhong Tang, Wenhai Liang
Circuits Systems and Signal Processing (2024)
Closed Access
Xuanzhong Tang, Wenhai Liang
Circuits Systems and Signal Processing (2024)
Closed Access
A Comprehensive Review of Machine Learning Applications in VLSI Testing: Unveiling the Future of Semiconductor Manufacturing
Sudipta Khan, Pradyut Sarkar
(2023), pp. 1-5
Closed Access | Times Cited: 1
Sudipta Khan, Pradyut Sarkar
(2023), pp. 1-5
Closed Access | Times Cited: 1
