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OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study
Chen‐Fu Chien, Hsin-Jung Wu
Journal of Intelligent Manufacturing (2022) Vol. 35, Iss. 1, pp. 275-287
Closed Access | Times Cited: 10

Showing 10 citing articles:

The Risk Analysis of Cart Development Based on Dynamic Bayesian Networks
Junjun Liu, Jun Yu
Research Square (Research Square) (2025)
Closed Access
Semiconductor probe card proactive maintenance using graph self-supervised learning and an empirical study
Tran Hong Van Nguyen, Chen‐Fu Chien
Computers & Industrial Engineering (2025) Vol. 203, pp. 110955-110955
Closed Access
Supply chain performance evaluation model for integrated circuit industry based on fuzzy analytic hierarchy process and fuzzy neural network
Qian Chen, Xiangping Wang
Journal of Intelligent Systems (2025) Vol. 34, Iss. 1
Open Access
Digital transformation for cost estimation system via meta-learning and an empirical study in aerospace industry
Tran Hong Van Nguyen, Pei-Min Huang, Chen‐Fu Chien, et al.
Computers & Industrial Engineering (2023) Vol. 184, pp. 109558-109558
Closed Access | Times Cited: 9
Advanced quality control for probe precision forming to empower virtual vertical integration for semiconductor manufacturing
Wenhan Fu, Chen‐Fu Chien, Chi-Hang Chen
Computers & Industrial Engineering (2023) Vol. 183, pp. 109461-109461
Closed Access | Times Cited: 7
Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study
Chen‐Fu Chien, Jiayu Peng
Journal of Intelligent Manufacturing (2024)
Closed Access | Times Cited: 2
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data
Young-Mok Bae, Young-Gwan Kim, Jeong-Woo Seo, et al.
Computers & Industrial Engineering (2023) Vol. 183, pp. 109547-109547
Closed Access | Times Cited: 4
A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and Quality in the Wafer Probing Process for Semiconductor Manufacturing
Woonyoung Yeo, Yung-Chia Chang, Liang‐Ching Chen, et al.
Sensors (2024) Vol. 24, Iss. 16, pp. 5116-5116
Open Access
Evaluation of geomorphological classification uncertainty using rough set theory: A case study of Shaanxi Province, China
Jilong Li, Shan He, Han Wu, et al.
Earth Surface Processes and Landforms (2024)
Closed Access
Denoising Method of Interior Design Image based on Median Filtering Algorithm
Tao Li
International Journal of Advanced Computer Science and Applications (2022) Vol. 13, Iss. 12
Open Access
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