OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation
Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, et al.
Lecture notes in networks and systems (2023), pp. 304-309
Closed Access | Times Cited: 7

Showing 7 citing articles:

Leveraging Transfer Learning for Efficient Surface Defect Detection on Metallic Components
Shengqi Wang, Anwar P. P. Abdul Majeed, Rui Song, et al.
Lecture notes in networks and systems (2025), pp. 815-825
Closed Access

Towards Automated Fracture Detection: A Study on Feature-Based Transfer Learning with Xception for Hairline and Avulsion Fractures
Hongwei Li, Anwar P. P. Abdul Majeed, Xiaoyan Liu, et al.
Lecture notes in networks and systems (2025), pp. 521-527
Closed Access

A Feature-Based Transfer Learning Method for Surface Defect Detection in Smart Manufacturing
Muhammad Ateeq, Anwar P. P. Abdul Majeed, Hadyan Hafizh, et al.
Lecture notes in networks and systems (2024), pp. 455-461
Closed Access | Times Cited: 2

Surface Defect Detection: A feature-based transfer learning approach
Anwar P. P. Abdul Majeed, Muhammad Amirul Abdullah, Ahmad Fakhri Ab. Nasir, et al.
Journal of Physics Conference Series (2024) Vol. 2762, Iss. 1, pp. 012088-012088
Open Access

Surface Anomaly Detection Using Feature-Based Transfer Learning for IoT-Enabled Smart Manufacturing
Muhammad Ateeq, Matilda Isaac, Hadyan Hafizh, et al.
Lecture notes in electrical engineering (2024), pp. 25-32
Closed Access

Feature-Based Transfer Learning for IoT-Enabled Defect Detection for Quality Control in Industrial Manufacturing Processes: A DenseNet Evaluation
Anwar P. P. Abdul Majeed, Muhammad Ateeq, Bintao Hu, et al.
Lecture notes in networks and systems (2024), pp. 443-449
Closed Access

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